18:3452 Ztdun (Part I)-1966 ( Reaffirmed 2002 ) Stadard SPECIFICATION FOR TOGGLE SWITCHES PART I GENERAL REQUIREMENTS AND TESTS ( Third Reprint SEPTEMBER 1992 ) ( Incorporating Amendments No. 1 & 2 ) UDC 621.316.542.1 @ Copyright 1975 BUREAU MANAK OF 9 INDIAN BAHADUR STANDARDS SHAH ZAFAR MARG BHAVAN, NEW DELHI 1loo02 Cr 6 September 1966 IS: 3452 ( Part I ) - 1966 Indian Standard SPECIFICATION PART I GENERAL FOR TOGGLE REQUIREMENTS-AND SWITCHES TESTS Electromechanical Components for' Electronic Committee, ETDC 37 Equipment Sectional Chairmanan BRIG B. M. CHAKRA~ARTX Representing Directorate General of Research % Development (Ministry of Defence) Members Central Electronics Engineering Research Ins& tute (CSIR), Pilani SHRI R. RAMACHANDRAN (AItc*nate) S&RI J. S. BHALLA All-India Radio Merchants' Association (AIRMA), Bombay SHRI V. J. BHATT (AClernatc) SHIU D. N..CHAUDHRI (Alternate) SHRI L. S. V. EASWAR (Altcrrrate) SHRI B. P. GHOSH ' National Test House, Calcutta SHRI K. N. GOPALAKR~SHNAN Director General of Civil Aviation (Ministry of Cjvi! Aviation) SHRI S. JALEEL HASAN Hylam Limited, Hyderabad SHRI S. S. CARDMAST& (Altematc) SHRI K. S. KELKAR Bharat Electronics Ltd. Bangalore SHRI K. GURIJRAJA (Alternate) SHRI S. D. KULKARNI Philips India Ltd. Calcutta SHRI A. DAS GUPTA (Altemale) SHRI H. J. MIRCHANDANI Indian Telephone Industries Ltd. Bangalore SHRI S. D. PANI. (Alternate) SHRI P. R. MULCHANDANI Mulchandani Electrical UC Radio Industries Ltd, Bombay LT CDR M. RAYACHANDRA Naval, Hekdquarters LT R. KOHLI (Afterrrtc) SHR~ V. RAMA RAO Atomic Energy Establishment, Trombay, Bombay SHRI T. V. A. SUBRAMANIAN (Alternate) SHRI C. L. SHARMA M.C. Engineering Co, New Delhi SHRI C. G. SUBRA~ANYAN * Research & Development Organization, Directorate of Standardization (Ministry of &fence) SHRI P. M. SHANKAR RAO (AlterHale) ( Con&& 011#we 2 ) DR G. N. ACHARYA RUREAU MANAK OF 9 INDIAN BAHADUR STANDARDS SHAH ZAFAR MARC3 BHAVAN. NEW. DELHI 1lOOU2 IS:3452 (Part I)-1966 Membms Refwesenting Directorate General of_ Posts & Telegraphs SARI T. S. SUBRAMANXAN (Ministry of Transport.& Comtionication) Directorate General of Inspection (&fin&&y of SHRI K. N. TIWARI Defence) SHRI C. KRISHNAMIJRTHY (Alternate) Telecommunication Industries, Bombay SRRI K. M. TOPRANI Radio & Electrical~ Mfg `CO Ltd, Bangalore SJIRI H. S. VXSWZSWARIAH &RI N. B. MANJANATEA RAO (Allcrsde) Director General, IS1 (Ex-oficio Member) SURI y. S. VBNXATESWARAN, Director (Elec tech) Secreiuvks SHRI S. SRINIVASAN Director (Telecommunication), IS1 SHRI N. SRINIVASAN Deputy Director (Elec tech), ISI 2 IS:5452 (Part r)-t966 CONTEN.TS PAGE . 0. FOREWORD 1. SCOPE SECTION ................ ............... I TERMINOLOGY AND REQUIREMENTS . .. . .. .. . . .. SECTION 2 .. . .. . ... . .. . .. TESTS ... .. . . .. . .. . .. .. . .I. 4 5 GENERAL 2. TERMINOLOGY .. . 3. CATEGORIES . .. RATINGS 5. ELECTRICAL 6. MARKING .. . ..a . . . . . . . . . 4. MATERIALSAND WORKMANSHIP ..L . . . . . . . . . . . . . . . OF TESTS ,.. 7. CLASSIFICATION FOR TESTS ' .. . 8. CONDITIONS 9. GENERAL EXAMINATION . .. 10. DIMENSIONS . .. . .. . .. .. . .. . . .. TESTS 11. ELECTRICAL TESTS 12. MECHANICAL 13. CLIMATICTESTS 14. ENDURANCETEST . . . . . . 8 9 9 10 . . . . . . . . . . . . . . . .i. . . . . . . 10 13 15 19 . . . . . . . . . .._ . . . . . . * _. APPENDIX A SEQUENCEOF TYPE TESTS . . . . . . 21 fs: 3452 (Part I) - 1966 lndiavt Sttidard SPECIFICATION PART I GENERAL FOR TOGGLE SWITCHES REQUlREMENTS.AND TESTS 0. FOREWORD 0.1 This Indian Standard (Part I) was adopted by the Indian Standards Institution on' 26 March 1966, after the draft finalized by the Electromechanical Components for Electronic `Equipment Sectional Committee had been approved by the Electrotechnical Division Council. 0.2 This standard deals with the general requirgments and tests for toggle switches. Detailed requirements `(including -dimensions) for various types of toggle swtichcs will be covered in individual specifications under preparation. 0.3 The object ot establishing a series of standards on toggle switches is to specify uniform requirements for judging the mechanical,.electrical and climatic properties as well as safety aspects, to describe test methods and to specify the dimensions for interchangeability and compatibility of toggle switches. 0.3.1 The switches used in electrical appliances and electrical wiring installations in buildings and other similar locations are not covered by this standard. 0.4 This standard is largely based on the corresponding recommendation of the International Electrotechnical Commission (IEC) as contained in Pub 131-l. (1962) ' Toggle switches: Part I General requirements and measuring methods `. 0.5 This standard requires reference to IS: 589-1961* SO far as the details of the climatic and mechanical testing procedures are concerned; only the relevant degrees of severity .and the' performance requirements have been specified in this standard. 9.6 This standard is one of a series of Indian Standards on electroOther standards pubmechanical components for electronic .cqUipment. lishcd so tar in the series are: IS: 2628(Part I)-1964 Specification for rotary Wafer switches (low current rating) : Part I Tests and. general requirements *Basic climatic and mechanical durability tests for electronic components (veoijed). IS: 3452 (Part I) - 1966 IS: 3354(Part I)-1965 Specification for valve sockets: Part I General requirements and tests IS: 3354(Part II\)-1965 Specification for valve sockets: Part II Dimensions and construction of gauges ;md tools IS: 3544-1966 General requirements and tests for tag strips 0.7 For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test or analysis, shall be rounded off.in accordance with IS: 2-l%W. The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard. 1. SCOPE 1.1 This standard (Part I) prescribes general requirements and methods of tests for judging the mechanical, electrical, and climatic properties of toggle switches intended for use in electronic and telecommunication equipment. 1.1.1 This standard does not cover the switches used in electrical appliances and in electrical wiring installations in buildings. SECTION I TERMINOLOGY AND GENERAL REQUIREMENTS 2. TERMINOLOGY 2.0, For the purpose of this standard, the following definitions hall apply. 2.1 To&e Switch -- A switch, the movement of the lever of which results in connection or disconnection of the switch terminations in a specified manner . 2.2 Position - A setting of the lever which results in a particular circuit condition.. A position may be momentary or maintained when the lever is released. 2.3 Clearance -The tive parts. shortest distance measured in air between conduc* shortest distance between of insulation with the switch conductive in any set 2.4 Creepage parts over the outer surface position. Distance - The 2.5 Electrical Ratings -The electrical ratings of a switch is given hy the combination of maximum voltage and maximum current under which the switch shall operate satisfactorily in `specified circuit conditions and at standard atmospheric conditions for testing: *Rules for rounding off numerical values (revised). 5 ISz 3452 ( Part I ) - 1966 2.6 Rated Voltage and Rated Current are marked on the switch. The voltage and current which 2.7 Type Tests --Tests carried out to prove conformity with the requirements of this standard. These are intended to prove the general qualities and design of a given type of switch. 2.8 Acceptance Tests -Tests carried out on samples selected from a lot for purposes of verifying the acceptance of the lot. 2.8.1 Lot -All toggle switches of the same type, category and rating manufactured by the same factory during the same period, using the same process and materials. 2.8.2 Tyfie - Identification given to variants of switches of the same designation, all switches of each such variant having similar design features and manufactured by the same techniques. carried out on each switch to check require2.9 Routine Tests -Tests mertts which are likely to vary during production. 3. GATEGORIES 3.1 There shah be three categories corresponding to three climatic severities 8s detailed beiow: (rcs IS: 589-1961+) C&&c Test I Category I 100°C -55*c 56 days 6 cycles -t 1_?5$Qto 44 mbar c Category II 85°C -40°C 56 days 6 cycles 0 `"1Z "c" 300 mbar the&y Category III , Damp heat (long term) Damp heat (accelerated) Low afr pressure zib"' Rapid change of temperature 70°C -10°C 21 days 2 cycles Not applicable 600 mbar NOTE 1 -In case of special requirements where the above categories cannot be applied, different combinations of climatic severities may be agreed to between the purchaser and the supplier provided that the degrees of severity are chosen from those'specified in IS: 589-1961.. NOPB 2 - A recovery period of 24 hours after the damp heat accelerated and aOmp heat long term tests is necessary for category III components. 4. iUATERIALS AND WORKMANSHIP Al Materlale - The switches shall be constructed from the most suitable materials which shall be free from flaws and shall conform to the reI&%t Indian Standard specifications, if any. AU materials used *B&c cUmatic and mechanical durability tests for electronic components (rrviorcr). 6 IS:3452 (Part I)- 1966 in the construction of the toggle switches shall be such as are not'susceptible to any mutual chemical reaction over the entire range of temperature for which the switches are designed. 4.2 Workma&~hip - All parts of the switch shall be manufactured and processed in a careful and workmanlike manner in accordance with the best current practice. 5. ELECTRICAL RATINGS 5.1 The relevant specifications for toggle switches shall include the following electrical details: a) Maximum voltage, b) Bfaximumcurrent, and c) Circuit conditions and associated combinations of voltage and current. 6. MARKING 6.1 Each switch shall be clearly marked with the following information, wheneverrelevant, in the order given below : a) Rated voltage, rated current and type of current; b) Manufacturer'stype number; c) Manufacturer'sname and/or trade-mark; d) Any additional requirements,if required by the purchaser or any other markingagreedto by the manufacturerand the purchaser;aud e) Country of manufacture. NOTE bkking de&Us shall be specified in the relevant specification. 6.1.1 The package of- the switch shall contain information about the category, sealed or unsealed and reference to relevant specification in addition to those specified in 6.1. 6.2 Any additional marking on the toggle switches and its packing shall be so applied as not .to cause confusion. 6.2.1 The &itches or their packing may also be marked with the IS1 CertificationMark. Indian Standarda Institution ( Certification Marks) Act and the Rules and Reguhions made thereunder. The ISI Mark on products covered by an Indian Sti Nora The use of the IS1 Ccr&cation `Makk is governed by the provisiona of the conveya the assurance that they have been prodticcd to comply with the requirements of that standard under a wcllQdincd rystcm of inspection, testing and quali control which is devised and rupcrvi4 by ISI and o ated by the producer. IS9 marked products are also cohtinuously checked by IS p"for conformity to that rtandard a a further mfcguard. D&la of conditiona uoder which a liccnce for the use of the ISI 7 IS: 3452 ( Part I) - 1%6 Certitication Mark may be granted to manufacturers from the Indian Standards Institution. or processors, may be obtained SECTION 7. CLASSIFICATION 7.1 Type Tests -The with IS: 2612-1965*. OF TESTS 2 TESTS procedure for type tests shall be in accordance 7.1.1 Number of Samples - The minimum number of samples for type tests shall be 24 of each category pertaining to each type of the to&e switch. 7.1.2 Seqzcence of Type Tests accordance with Appendix A. 7.2 Routine Tests to test for general examination The sequence of type tests shall be in 7.2.1 Every switch shall be subjected (see 9). 7.3 Acceptance Tests 7.3.1 Acceptance tests shall be carried out on a limited number of samples which have passed the routine test and selected in accordance with the sampling procedure given in IS: 2612-1965*. 7.3.2 Two groups of samples, one for nondestructive tests (Group A) and the other for destructive tests (Group B), shall be selected (see Appendix B of IS: 26X+1965*) and the switches in each group shall be subjected to the following tests; Group A (NW-destructive) a) Contact resistance, b) Voltage proof, c) Insulation r,esktance,~and d) Sealing (for sealed types only). Group B (Destructive) a) Dimensions, b) Steady load, c) Terminal strength* d) Soldering, e) Bumping, f) Overload, and g) Climatic sequence. components. *Recommend&ions for type approval and sampling procedures for electronic 8 IS:3452 8. CONDITIONS FOR TESTS (Part I)-1964 tests shall be carried out on the switches as 8.1 General -The received from the manufacturer or the supplier. In no case shall the contact parts be cleaned or otherwise prepared prior to th& tests-unless explicitly so agreed. 8.2 Mounting -.Where mounting is specified in a test, the switches shall be rigidly mounted on a metal plate using its normal fixing device, the dimensions of the mounting plate being such that the contour of the specimen under test is exceeded. 8.3 Selection of Samples - The samples for testing shall be so selected as to be representative of each category of the relevant type of toggle switches. 8.4 Atmospheric Conditions for Testing - Unless otherwise specified, all tests shall be carried out under standard atmospheric conditions for testing specified in IS: 589-1961*. 8.5 Preconditioning - Before shall be stored at the measuring the entire switch to reach that for after conditioning is adequate measurements are made, the switches temperature for a time sticient to allow temperature. The recovery period called for this purpose. 8.6 Correction to be Applied - When measurements are made at an ambient temperature other than the `reference temperature, the results shall, where necessary, be corrected to the reference temperature. The ambient temperature during the test shall be stated in the test report. 8.7 Other Precautions -During measurements, the switches shall not be exposed to draughts, direct sun rays or other influences likely to cause errors. 9. GENERAL EXAMINATION shall be visually examined for conformity 9.1 The toggle switches with 9.1.1 to 9.1.3. 9.1.1 The marking shall be in acc'ordance with 6. 9.1.2 The switches shall be complete and workmanship, finish and assembly shall be satisfactory. The visual examination shall also include a check that the switch is mechanically operable. 9.1.3 Each locking nut shall have a well-formed full thread and shall be a good running fit on the fixing bush. *Basic climatic (revised). and mechanical durability tests for electronic components 9 IS:3452 (Part I)-1966 9.2 There shall be no deterioration (in the features mentioned in 9.1.1 to 9.1.3)after mechanical, electricaland climatic tests. 10. DIMENSJ0NS W.1 The dimeusions of the switch shall be checked. in accordance with those specified the relevant types of toggle switches. in the relevant This shall be specification for 11. ELECTRICAL TRSTS 11 .l Contact Resistance 11.1.0Two measuring voltages are specified for the measurement of contact resistance. Applicable test voltage shall be indicated in the relevant specification for toggle switches. Requirements - Measurement may be carried or alternating current. In the case of dispute. the dc measurement ,shall govern. The contact resistance shall normally be calculated from the potential difference measured between the points intended for connection of the wiring. The contact shall be made before the measuring voltage is applied. In order to prevent undue heating of the contacts, the current flowing shall not exceed 1 A or the value specified in the relevant specification. For ac measurements, the frequency shall be 1000 3 200 c/s. The measuring apparatus shall be such as to ensure an accura@ of fl0 percent. out with direct curwrt 11.1.1Cmtml Memktzg of the following voltage shall be 1I .1.2 &@si4%g voltage -Either applied ss' called for in the relevant specification : a) emf of the measuring circuit shall not exceed 25 V (dc or ac peak) b) emf of the measuring circuit shall not exceed 20 mV (dc or ac peak) Nom -The low level measurement is carried opt in order to prevent the breakdown of knsulating films on the contacts. 11.I .3 Measuring Cycle 11 .1.3.1Measurement with dc One measuring cycle consists of: Making the contact, tinnection of voltage source, Measurement with current flowing in one direction, Measurement with current flowing in opposite direction, Disconnection of voltage source, and Breaking the contact. 10 IS: 3452 ( Part f ) - 1966 11.1.3.2 Measuremed with ac - One measming cycle consists 6f : a) b) c) d) e) Making the contact, Connection of voltage source, Measurement, Disconnection of tiage source, and Breaking the contact. 11.1.3.3 The measuring cycles shall be carried out in immediate succession. g 1 .I .4 lkfeasummd - The contact resistance shall be measured between any pair of +erminations that are connected by the contacting device. There shall be five measuring cycles. 11 .I .5 Requirmmts - The value of the contact resistance for any ipdividtial measurement Shall not exceed the value specified in the relevant specification. P&E - For low current contacts for use in the microvolt range, modifications of tk measuring method and/or special requirements may be specified in the relevant specification. 11.2 Insubdon Resistance and lL2.t Toggle switches shall be mounted as specified in 8.2 the insulation resistance measured between the folloting points: a) Mounting plate and all parts intended to be electrically insulated from it connected together, and b) Adjacent parts intended to be electricaliy .insulated from each other. 11.23 The measm-ing voltage shall be a dc voltage of 500 f50 V or 100 -&I5 V as specified in the relevant specification-andshall be applied for a period of .l minute&5 seconds. 31.2.3 The insulation resistance shall be not less than those specified in the relevant specification. 118 Voltage Proof 11.3.1 Toggle switches as specified in 8.2. shall be mounted in the normal manner Il.32 Au ac test voltage of three times-the maximum voltage or 500 V, whichever- is higher (unless otherwise specified in the relevant specification) shall be applied for a period of one minute between the terminations chosen for the insulation resistance test (see 11.2). 11.3.3 The switches shall, withstand without breakdown or flashover. 11 the application of the voltage IS: 34;2 ( Part I) - 1%6 Test 11.4 Capacitance 11.4.1 The switches shall be mounted as specified in 8.2. 11.4.2 The capacitance shall be measured between : a) any two adjacent terminations which are not electrically connected permanently, and b) each termination and all other metal parts. 11.4.3 Unless otherwise specified, the capacitance shall be measured at 1 MC/Sf ZOOc/s. 11.4.4 The value of the capacitance as measured between the specified terminations shall not exceed the limits laid down in the relevant specification. 11.4.5 All subsequent measurement of capacitance after various other tests shall be repeated on the same pair of contacts as selected in 11.4.2. 11.5 Radio Frequency Shunt Resistance (Parallel Damping) at a frequency between two contacts specified in the relevant specification. 11.5.3 The measuring method shall be chosen so as to ensure accuracy of -& 10 percent. 11.5.4 The value of radio frequency resistance shall be not less than that specified in the relevant specification. 11.6 Noise - Under consideration. 11.5.1 The toggle switches shall be mounted as specified in 8.2. 11.5.2 The radio frequency shunt resistance shall be measured 11.7 Overload Test 11.7.1 The switch shah be operated mechanically for 50 cycles at a rate of five to six cycles per minute to make and break the current specified in 11.7.2. A cycle consists of moving the lever from one end position through all other positions and return to the,end position. 11.7.1.1 Return from momentarily actuated positions shall be accomplished solely by the internal switch mechanism. 11.7.1.2 For double throw switches, one-half of the switches shall be tested with the circuit connected to one set of contacts and the remaining half with the circuit connected to the other set of contacts. 11.7.1.3 For multipole switches, each pole of the switch shall be tested simultaneously with the other pole(s). 11.7.2 The following two tests shall be carried out in resistive circuits, separate components being used for each test : a) With the minimum dc voltage and twice the associated current, and 12 . IS: 3452 (Part I) - 1966 b) With the maximum ac voltage and twice the associated current. 11.7.2.1 For both tests, the duty cycle shall be approximately 50 percent ' on ' and 50 percent ' off `. 1117.3 The switches shall then be subjected to the following tests in the order indicated; and shall meet the requirements specified in the relevant specification : a) Contact resistance, b) Insulation resistance, and c) Sealing (for sealed switches only). 12. MECHANICAL TESTS 12.1 Operating Force 12.1.1 The switch shall be mounted as specified in 8.2. 12.1.2 The force necessary to move the lever from any position to another shall be measured. 12.1.3 The measured value of operating force shall lie within, the limits specified in the relevant specification. 12.2 Impact Test on Actuating Lever 12.2.1 The switches shall be mounted rigidly in the normal manner as specified in 8.2. 12.2.2 The mechanical strength of the lever is tested with the aid of an- impact test apparatus. The striking element of the apparatus is a hammer with a hemispherical face made of hard wood, the radius of the sphere being 10 mm. With the aid of the apparatus 10 blows are applied to the lever, the impact energy in each blow being 5.5 kgf/cm, unless otherwise specified in' the relevant specification. 12i2.3 After the test, there shall be no sign of deterioration and the switch shall still be mechanically operable. 12.3 Steady-Load on Actuating Lever 12.3.1 The switches shall be mounted rigidly in the normal manner as specified in 8.2. 12.3.2 A force of 10 kgf shall be applied to the tip of the actuating lever for 1 minute under each of the following conditions : a) Perpendicular to the lever axis and in the plane of lever travel and at each end position of the lever, b) Perpendicular to the lever axis and perpendicular to the plane of lever travel at each position of .the lever, 13 IS:.3452 ( Part I ) - 1966 c) Axially with the lever axis towards the lever pivot, and d) Axially with the lever axis away from the lever pivot. 12.3.3 The torque shall be applied to the lever for one minute in either direction. The value of the torque shall be 1.0~ d kgf.cm,`where d is the maximum diameter of the lever in millimetres. 12.3.4 After the test, there shall be no sign of deterioration the switch shall still be mechanically operable. 12.4 Robustness of Terminations and 12.4.1 This test shall be carried out in accordance with 7.19.1. of IS: 589-1961*, the loading weight being as specified in the relevant specification. 124.2 There shall be no sign of failure and the &itch shall still be mechanically operable. 12.5 Switching Mechanism Test 12.5.1 The correct functioning of the switching mechanism shall be checked by setting the lever within the specified angle from the theoretical position. The switching mechanism shall then cause the switch to operate correctly. This operation shall be carried out in each appropriate direction for each specified position. 12.6 Soldering 12.6.1 The switches shall be subjected to the soldering iron test in accordance with 7.18.3 of IS: 589-1961*. 12.6.1.1 The period of recovery shall be as specified in the rejevant specification. 12.6.2 After the test, the switches shall be visually examined and there shall be no fracture, loosening of parts or any other mechanical failure. 12.7 Vibration 12.7.1 The switches shall be mounted in the normal manner on a vibration table and subjected to the vibration test in accordance with 7.6 of IS : 5891961*. 12.7.1.1 During the vibration test, continuous monitoring shall be carried out to determine the intermittency of electrical contact by applying the voltage and current used for contact resistance measurement. NOTE-A typical method of continuous monitoring is under consideration. and mechanical durability tests for electronic components *Basic climatic (TCViSCa). 14 IS: 3452 (Part I) - 1966 12.7.2 There shall be no .loosening, of parts or any other mechanical failure. The fixing shall not become loose; 12.7.3 The contact resistance Shall be measured as in 11.1 after the test and the values shall not exceed the limits specified in the relevant specification. switches shall be mounted. in the normal 12,8 Acceleration -The During the test, the manner on a table of acceleration test machine. electrical continuity shall be continuously monitored. There shall be no intermittency electrical continuity of duration greater than that specified iu the relevant individual specification. KoTx - A continuous monitoring circuit is under consideration. 12.8.1 The switches shall be subjected to the acceleration test in The severities of acceieration accordance with 7.7 of IS: 589-1961*. shall be as specified in the relevant specification. 12.S.2 The duration 8 minutes. of the acceleration test in each case shall be ES.3 During the acceleration test, there shall be no spurious operation. After the acceleration test, the switches shall be visually examined and there shall be no fracture or loosening of parts or any other mechanical failure. The fixing shall not become loose. 12.S.4 The contact resistance shall then be measured and the value of the contact resistance shall not exceed the limit specified in the relevant specification. 12.9 Shock -.The component shall be mounted on the moving table of shock test apparatus in its three principle axes in turn and subjected to. the shock test in accordance with 7.5.2 of IS : 589-1961*. 129.1 During the test, electrical continuity shall be continuously monitored. There shall be no intermittency of electrical continuity of duration greater than that specified in the relevant individual specification. ( This is not applicable for category 3 components. ) 12.9.2 During the shock test, there shall be no spurious operation. After shock test the components shall be visually examined and there shall be no fracture or loosening of parts or other mechanical failure. The fixing shall not become loose. 12.993 The contact resistance sball.be measured and the value shall not exceed the limits specified in the relevant specification. *Basic (reuisrd). climatic and mechanical durability tests for electronic components 15 IS : 3452 .( Part I) - 1966 12.10 Bump-The component shall be mounted in the normal manner on a table of bump test machine in accordance with 7.5 of IS: 589-1961*. 12.IO.l The component shall then be subjected to the bump test in accordance with 7.5.1 of IS : 589-1961* for 4 000 bumps. 12.10.2 During the test, the eIectrica1 continuity shall be continuously monitored. There shall be no intermittency of electrical continuity of duration greater than that specified in the reIevant specification. 12.10.3 After the bump test, a component shall be visually examined and there shall be no fracture or loosening of parts or other mechanical failure. The fixing shall not become loose. 12.10.4 The contact resistance shall be measured and the value shall not exceed the limits specified in the relevant individual specification.' 13. CLIMATIC TESTS -- The switches shall be preconditioned as I3:l Preconditioning specified in 8.5. 13.2 Climatic 13.2.1 Dry Heat 13.2.1.1 The switches shall be subjected to. the dry heat test in accordance with 7.2 of IS: 589-1961*. 13.2.1.2 The temperature of the test chamber shall be maintained at the appropriate maximum value for the category. 13.2.1.3 At the end of the period of conditioning and while still at the high temperature, the insulation resistance shall be measured. The value' of the insulation resistance shall be not less than that specified in the relevant specification. 13.2.1.4 While at the high temperature, the switches shall be mechanically operable. 13.2.1.5 The switches shall then `be removed from the dry heat chamber and allowed to remain under standard recovery conditions. 13.2.2 Darn9 Heat (Accelerated) Sequence First Cycle 13~2.2.1 This test shall be carried out in accordance with 7.4 of IS: 58%1961*. 13.2.2.2 After the specified period of conditioning, the switches shall be removed from the chamber and allowed to recover under conditions appropriate to the test and then visually examined. *Basic climatic (rcuised). and mechahical durability tests for electronic components 16 IS : 3452 (Part 13.2.2.3 There shall be no visible damage to the switch. ing shall be legible and indelible. I ) - 1966 The mark- 13.2.3 Cold 13.2.3.1 This test shall be carried out in accordance with 7;l of IS: 589-1961*. 13.2.3.2 The temperature of the chamber shall be maintained at the appropriate minimum value-for the category of the switch under test and the duration of the exposure shall be two hours. 13.2.3.3 At the end of this period, and while still at the low temperature, there shall be a check to see, that the switch is mechanically operable; 13.2.3.4 The capacitance shall be measured in accordance with 11.4 and shall be within the limits specified in the relevant specification, 13.2.3.5 The switches shall then be removed from thechamber and exposed to the standard recovery conditions appropriate to this test. 13.2.4 Low Air Pressure 13.2.4.1 This test shall be carried out in accordance with `7.12 of IS: 589-1961*. 13.2.4.2 The test chamber shall be maintained at a temperature of 15" to 35°C and at a pressure appropriate to the category of the switch; the duration of the test shall be five minutes. 13.2.4.3 During the conditioning, a dc or ac (peak) voltage of `twice the maximum `voltage (for low air pressure), as specified in the relevant specification, shall be applied between the points mentioned in 11.2.1. 13.2.4.4 During and after this'test, there shall be no sign of glow discharge, breakdown, flashover or harmful deformation of the switch. 13.2.5 Damp Heat (Accelerated) Remainiug Cycles 13.2.5.1 This test shall be carried out in accordance with 7.4 of IS: 589-1961* for the remaining number of cycle(s) appropriate to the category of the switch. NOTE -The remaining damp heat cycles required are as follows: Category Category Category I - 5 cycles II 75 cycles III - 1 cycle *Basic (revised). climatic and mechanical dhrability tests for electronic components 17 IS:3432 (P@rt I)-1966 13.2.3.2 At the end of the specifkl number of cycles, the switches ;shalI_@eremoved from the chamber and allowed to recover under recovery condrtrong appropriate to thrs test except for Category III for which the recovery period shall be 24 hours. 13.2.5.3 The switches shall then be subjected to the following tests in the order indicated and shall meet the requirements specified in the relevant specification : a) Contact resistance, b) Insulation resistance, @ Voltage proof, d) Capacitance, and e) Visual inspection. 13.3 Damp Heat (Long Term Exposure) 13.3.1 The switches shall be subjected with 7.3 of IS: 589-1961*. to this test in accordance 13.3.2 The duration of the exposure shall be appropriate to the category of the switch. 13.3.3 During conditioning, a polarizing voltage shall be applied between: a) two adjacent terminations having minunum spacing; and b) all remaining terminations connected together and all other metal parts. 13.3.3.1 The positive potential shall be applied to the terminations. ' The vilue of the polarizing voltage sh& be 15 V dc unless otherwise specified. 13.3.4 At the end of the period of exposure, the switches shall be removed from the chamber and allowed to remain.under recovery conditions appropriate to this test except for Category III switches for which the recovery period shall be 24 hours. 13.3.5 The switches shall then be subjected to the test specified in 13.2.5.3 and shall meet the requirements specified in the relevant `specification. 13.4 Rapid Change of Temperature 13.4.0 This test is applicable only to toggle switches of Category I and Category. II. 13.4.1 The switches shall be subjected. to this test in accordance with 7.14 of IS: 5891?61*. *Basic clhnatic and ~mechanical durability tests for electronic componenp 18 (m&cd). IS : 3452 Uart I) - 1966 13.4.2 The maximum and mixjimum temperature shall be appropriate to the categofy of the switch. The total number of cycles shall be five: 13.4.3 After the exposure, the switches shall be removed from the chamber and allowed to remain under recovery conditions appropriate to this test. 13.4.4.The switches shall then be subjected to the tests mentioned in 13.2.5.3 and shall meet the requirements speecified'in the relevant specification. 13.5 Sealine (For Sealed Types Only) 13.5.1 Sealing (IVormal) of 13.5.1.1 This test shall be carried out .in accordance with 7.15.2 IS : 589-1961*. 13.5.1.2 The rate of leakage 06 air shall not exceed the v&es fied in the relevant specification. 13.8.2 Sealing (Exteded) 13.5.2.1 This test shall be carried out in accordance IS: 589-1961*. with 7.15.3 of speci- 13.5.2.2 The iate of leakage of air &all not exceed the value specified in the relevant specification. 13.6 Salt Mist The switches shall be mounted normally as specified h 8.2. with 7.10 of 13.6.1 13.6.2 This tkst shall be carried out in accordaice IS: 589-19618, the period of exposure bebg four days. 13.6.3 After the specified period of exposure, the switches shall be allowed to recover under the recovery conditions appropriate to this test. 13.6.4 The switches sha!l then be subjected to the tests mentioned in J3.2.5.3 md shall meet the appropriate requirements as laid down in the relevant specification. 13.7 Mould Growth 13.7.1 This test shall be carried out in accordance 589-1961*. *Basic (rruistd). with 7.9 of IS: climatic and mechanical durability tests for electronic components 19 IS : 3452 ( Part I ) - 1%6 13.7.2 After the expiry of the specified period of exposure, there shall be no mould growth on the switches visible to the naked eye; 13.8 Dust Under consideration. TEST * 14. ENDURANCE 14.0 Twp tests have been specified, the first one being applicable to switches of Categories I and II while the second test is appli`cable to switches of Category IIJ 14.1 Endurance Test for Category I and Category II Switches 14.1.1 This test shall be carried out at the appropriate maximum category temperature. The switches shall remain in the chamber for a total period of 2000 hours, During the latter part of the 2000 hours period, the switches shall be operated mechanically to make and break the currents specified in 14.1.2 at a rate of 10 to 12 cycles per minute. 14.1.1.1 A cycle consists of moving the lever from one end position through all other positions and return to the end position. 14.1.1.2 Return from momentarily actuated accomplished solely by the internal switch mechanism. positions shall be 14.1.1.3 For double-throw switches, one-half of the switches ,shall be tested with the circuit connected-to one set of contacts and the remaining half with the circuit connected to the other set of contacts. 14.1.1.4 For. multipole -switches, each pole of the be tested simultaneously with the other .pole(s). switch shall 14.1.2 The following tests shall be carried out on separate switches, 10 000 cycles being performed in each case (see 14.1.1) : 4 Inductive Circuit - The test, shall be carried out using an inductive circuit with the dc voltage and .the current as specified in the relevant specification. The ciicuit used for this test shall have a time constant between 2 and 3 seconds. The duty cycle shall be approximately 25 percent ` on ' and 75 percent ' off `. Lamp Load - The test shall be carried out using a lamp load with W dc voltage and the cur rent as specified in the relevant specification. Only tungsten .lamps having a nominal power of 25 W at the voltage specified in the relevant specification shall,be, used for the load. The duty cycle shall be approximately 25 percent ' on ' and 75 percent `.off `. 4 Reddive Circuit -The test shall be carried out using a resistive circuit with, the ac voltage and the current as specified in 20 IS: 3452 (Part I) - 1966 The duty cycle shall be approximately the relevant specification. 50 percent ` on ' and 50 percent ` off ' 14.1.3 The switches shall then be subjected to the following tests in the order indicated and shall meet the requirements specified in the relevant specification : a) b) c) d) e) f) Impact test on actuating lever, Steady load test on actuating lever, Contact resistance, Insulation resistance, Voltage proof, and General examination. Test for Category III Switches 14.2 Endurance 14.2.1 The switches shall be operated mechanically to make and break the currents specified in 14.2.2 at a rate of 10 to 12 cycles per minute. 14.2.1.1 A cycle shall consist of moving the lever from one end position through all other positions and return to the same end position. 14.2.1.2 Return from momentarily actuated accomplished solely by the internal switch mechanism. positions shall be 14.2.1.3 For double-throw switches, one-half of the switches shall be tested with the circuit connected to one set of contacts and the remaining half with the circuit connected to the other set of contacts. 14.2.1.4 For multipole switches, each pole be tested simultaneously with the other pole(s). of the switch shall 14.2.2 The tests specified in 14.1.2 shall be carried out on separate switches, 10 000 cycles being performed in each case. 14.2.2.1 The switches shall then be subjected to tests specified in 14.1.3 and shall meet the requirements specified in the relevant specification. 21 IS:3452 /Part I)-1966 APPENDIX (Clawe A 7.1.2) SEQUENCE OF TYPE TESTS 22 Samples 4 General, Examination 4 Dimensions 4 Contact Resistance + Insulation Resistance 4 Voltage Proof + Frequency Shunt Resistance s Sealing (Normal) 4 7 (4 samples) 4 Damp heat long term & Sealing (normal) Radio (4 samples) 4 Impact test on actuating lever 4 Steady load test on actuating lever c Switching mechanism G Operating force 4 Soldering & Robustness ?f terminations * Voltage proof 5 Rapid change of temperature + Vibration including variation of contact resistance t Acceleration 4 Shock J Uump 4 Climatic sequence & Sealing fnormal) 4 (4 samples) 4 Impact test on actuating lever 4 Steady load test on actuating lever 4 Capa.citance N&e 4 Overload Scaling (normal) & Salt mist + G (6 samples) c Endurance 4 Sealing (normal) 4 (4 s&ples) 4 Sealing {extended) 1 Dust 5 Mould growth 4 22 BUREAU Heedquarters: Manak Bhavan, OF 9 Bahadur INDIAN STANDARDS Shah Zafar Marg, NEW DELHI 110002 Telephones: 331 01 31, 331 13 75 Regional Central Offices: Telegrams: Manaksanstha ( Common to all Off ices) Telephone 331 01 31 331 13 75 I 36 24 99 Bhavan, 9 Bahadur Shah Zafar Marg. NEW DELHI 110002 : l/l 4 C. I. T. Scheme VII M, V. I. P. Road. *Eastern Maniktola, CALCUTTA 700054 Northern : SC0 445-446, Sector 35-C, CHANDIGARH 160036 Southern TWestern : Manak : C. I. T. Camous, : Manakalaya, BOMBAY MADRAS 600113 Andheri E9 MIDC, 400093 Marol, 21843 3 16 41 24 I 41 25 141 29 ( East ), 6 32 92 I 41 42 19 16 95 Branch Offices: Marg, Khanpur, I Tumkur Road I 2 63 48 2 63 49 38 49 55 38 49 56 667 16 IPushpak', Nurmohamed Shaikh AHMADABAD 380001 SPeenya Industrial Area BANGALORE 560058 1st Stage, Bangalore Gangotri Complex, 5th Floor, Bhadbhada Road, T. T. Nagar, BHDPAL 462003 Plot NO. B2;83. Lewis Road. BHUBANESHWAR 751002 5,315. Ward No. 29, R.G. Barua Road, 5th Byelane, GUWAHATI 781003 5-S-56C L. N. Gupta Marg ( Nampally Station Road ), HY DERABAD 500001 R14 Yudhister 117/418 Marg. C Scheme, Nagar, JAIPUR 302005 208005 i 5 36 27 3 31 77 23 1083 6 6 21 1 21 6 I6 16 34 98 68 a2 23 21 21 `?I 32 76 92 05 04 17 71 B Sarvodaya KANPUR Patliputra Industrial Estate. PATNA 800013 T.C. No. 14/l 421. University P.O.. Palayam TRIVANDRUM 695035 /nspection Offices ( With Sale Point ): Pushpanjali, First Floor, 205-A West High Court Road, Shankar Nagar Square, NAGPUR 440010 Institution of Engineers ( India ) Building, 1332 Shivaji Nagar. PUNE 411005 ?bt 5 24 35 *Sales Office art Calcutta is at 5 Chowringhae Approach, P Cl. Prtnc!.y 2: 66 l?i', Street. Calcutta 700072 tSales Office In Bombay is at Novelty Chambers, Grant Road, 69 ti5 IO Born& 400007 iSales Office in Bangalore is at LJnitv Building. Naras mharaia Square. 2:' 76 7! Ban&?lOre 66OOO2 AMENDMENT NO. 3 TO JUNE 1991 IS 3452 ( Part 1) : 1966 SPECIFICATION FOR TOGGLE SWITCHES PART 1961'. ( Pugu'r),foot-note existing foot-note: `*Basic environmeetal 1 GENERAL REQUIREMENTS Substitute AND TESTS `IS 58: for the : ( Page 4, clause 0.5, line 1 ) - `IS : 9COO*' fir the following with c*' mark ) testing procedures Substitute for electronic and electrical items.' stitute ( Page 6, clause 3.1, Below climatic test and Note `IS 9000 ( Part 1 ) : 1988*`for `IS S89 : 1961'. Substitute for electronic 1, line 4 ) following electrical Sub- ( Page 6, foot-note with `*' mark ) existing foot-note: `*Basic environmental Part 1 General.' ( testing procedures the for the im : aod Page 9, clause 8.4, line 3 ) - Substitute `IS 9000 ( Part I ) : 19W' /op `IS 589 : 1961'. ( Page 9, foot-note with `*' mark ) existing foot-note: `+Dasic environmental Part 1 General.' testing procedures Substitute for the following aod for the imnr 9fYO 18 ) : electronic el~ctricd `IS ( Part ( Page 14, clau.re 12.4.1, Zincs 1 and 2 ) ( Part 19 ) : 1986*`for `7.19.1 of IS 589 : 1961'. Substitute `IS 9000 `IS 9000 ( Page 14, clause 12.6.1, line 2 ) 1981t'for `7.18.3 of IS 589 : 1961'. Substitute ( Page 14, clause 12.7.1, line 3 ) -Substitute 198SS'for `7.6 of IS 589 : 1961'. ( Page 14, foot-note with `*' mark ) existing matter: Substitute ( Part 8 ) : for the itcmr iterm: items : the following electriul electrical electrical `*Basic environmental tenting procedurea for electronic and Part 19 Robustness of terminations and iotegrat mounting devices. tBasic environmental Part 18 Solderability test. fBasic environmental Part 8 Vibration ( sinusoidal testing testing ) test.' procedurea procedures for electronic for electronic and and : I ( page 15, clause 12.8.1, line2 ) - Substitute `IS 9000 ( Part 9 ) : 1): 1981*`for 1979.yfor `7.7 of IS 589 : 1961'. Substitute `IS 9000 ( Part 7/Set the following ( Page 15, clause 12.9, line 3 ) `7.5.2 of IS 589 : 1961'. matter: environmental testing t steady state ). procedures procedures ( Page 15, foobnote with I*' mark > - Substitute for the existing `*Basic Acceleration for electronic for electronic and electrical and electrical items : Part 9 items tBasic environmental testing Impact test, Set 1 Shock.' : Part 7 ( Page 15, clauses 12.10 and 12.10.1, Zinc 2 ) Substitute ( Part 7/Set 2 ) : 1979*`.for `7.5 and 7.5.1 of IS 589 : 1961'. `IS 9000 ( Page 15, clause 13.2.1.1, line2 ) - Substitute 1977t'for `7.2 of IS 589 : 1961'. 19aqyr `IS 9000 ( Part 3 ) : `IS 9000 ( Part 5 ) : for the : Part 7 : Part 3 : Part 5 9000 13 ) : 9000 ( Page 15, clause 13.2.2.1, line 2 ) `7.4 0f IS 589 : 1961'. with `*' mark ) testing testing testing procedures procrdtwrs procedures Substitute Substitute ( Page 15,foot-note existing matter: `*Basic environmental Impact test, Set 2 pump. Dry tpasic heat environmental test. the following and electrical and and rlrctrical electrical items items items for electronic for electronic for electronic $Basic environmental Damp heat cyclic test.' ( P&e 1.6, clause 13.2.3.1, lines 1 and 2 ) ( Part 2 ) : 1977*`for '7.1 of IS 589 : 1961'. Substitute `IS 193lt ( r'uge 16, clause 13.2.4.1, line 2 ) for ~7.12 of IS 589 : 1961'. Substitute `IS 9000 ( Part Substitute the following and electrical items: items: item: ( Page 16, clause 13.2.5.1, lines 1 and 2 ) ( Part 5 ) : 1981S'for `7.4 of IS 589 : 1961'. ( Page 16, foot-note with C*' mark ) existing matter: `*Basic Cold test. environmental testing testing procedures procedures procedures `IS Substitute for the Part Part 2 13 5 for electronic for electronic for electronic tBasic environmental Low air pressure test. and electrical and electrical fBasic environmental testing Damp heat ( cyclic ) test.' ( : Part 1979*`$oT Page 17, clause 13.3.1, line 2 ) `7.3 of IS 589 : 1961'. 2 Substitute `IS 9000 ( Part 4 ) : ( Puge 17, clause 13.4.1, line 2 ) 1988t'J-v `7.14 of IS 589 : 1961'. ( Page 17,foot-note existing matter: `*Basic environmental Damp heat steady state. tBasic environmental Change of temperature.' Substitute IIS 9000 ( Part 14 ) : with `*' mark ) testing procedures procedures Substitute the following for the and and electrical electrical items items for electronic for electronic : Part 4 : Part 14 testing ( Page 18, clause 13.5.1.1, line 2 ) 1982*`for `7.X5.2 of IS 589 : 1961'. Substitute `IS 9000 ( Part 15 ) : ( Part 15 j : ( Part 11 ) : `IS 9000 ( Page 18, clause 13.5.2.1, line 2 ) 1982*`for `7.15.3 of IS 589 : 1961'. ( Page 18, clause 13.6.2, line 2 ) 1983f'fot `7.10 of IS 589 : 1961'. Substitute `IS 9000 Substitute 2 )`IS 9000 ( Page 18, clause 13.7.1, fines 1 and ( Part 10 ) : 1979f'fiJor `7.9 of IS 589 : 1961'. ( Page 18, foot-note with `*' mark ) existing matter: `*Basic environmental Sealing test. tBasic environmental Salt mist test. fBasic environmental Mould growth test.' testing testing testing procedures procedures procedures Substitute Substitute the following for the and electrical and electrical and electrical items items items for electronic for electronic for electronic : Part 15 : Part 1 I : lart IO 3 Reprography Unit, BIS, New Delhi, India